Title :
Wavelength influence on CMOS SOS IC dose rate laser simulation efficiency
Author :
Skorobogatov, Petr K. ; Nikiforov, Alexander Y. ; Egorov, Andrey N. ; Ulanova, Anastasia V. ; Davydov, Georgii G.
Author_Institution :
NRNU MEPhI, Moscow, Russia
Abstract :
Dose rate effects wavelength dependence under pulsed laser irradiation of typical CMOS thin-film structure is investigated. The optimal wavelength for maximum laser simulation efficiency is defined.
Keywords :
CMOS integrated circuits; laser beam effects; silicon-on-insulator; CMOS SOS IC dose rate; CMOS thin-film structure; laser simulation efficiency; pulsed laser irradiation; wavelength influence; Absorption; CMOS integrated circuits; Inverters; Lasers; Logic gates; Radiation effects; Semiconductor device modeling; SOS structure; dose rate effects; laser wavelength;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937412
