DocumentCode
1992842
Title
Sensitivity and uniformity of a 0.18µm CMOS temporal contrast pixel array
Author
Posch, Christoph ; Matolin, Daniel
Author_Institution
AIT - Austrian Inst. of Technol. GmbH, Vienna, Austria
fYear
2011
fDate
15-18 May 2011
Firstpage
1572
Lastpage
1575
Abstract
A QVGA array of autonomous, event-based temporal contrast sensitive pixels is at the basis of an asynchronous, time-based CMOS dynamic vision and image sensor (ATIS). In this sensor, exposure measurements are initiated and carried out locally by individual pixels upon detection of temporal contrast in their field-of-view. The change detection pixel circuits respond with low latency to temporal contrast (i.e. relative changes in illumination) by generating `spike´ pulse events. The vision sensor has been implemented in a 0.18μm CMOS process, fabricated and characterized. To assess the quality of the change detector array, contrast sensitivity, noise behavior and response uniformity are crucial performance figures. In this paper, we propose a test method that allows acquiring and evaluating these three performance parameters simultaneously. The results are shown to agree well with predictions from theoretical considerations, validating the proposed test method. The ATIS change detector array exhibits RMS noise equivalent contrast between 2% and 4% and achieves array response mismatch of 1.9% RMS.
Keywords
CMOS image sensors; computer vision; least mean squares methods; CMOS image sensor; QVGA array; RMS noise; change detection pixel circuits; change detector array; dynamic vision; exposure measurements; sensitivity; size 0.18 mum; temporal contrast pixel array; Arrays; Noise; Noise measurement; Photoconductivity; Photoreceptors; Pixel; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location
Rio de Janeiro
ISSN
0271-4302
Print_ISBN
978-1-4244-9473-6
Electronic_ISBN
0271-4302
Type
conf
DOI
10.1109/ISCAS.2011.5937877
Filename
5937877
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