• DocumentCode
    1992856
  • Title

    A Method for Accurate Measurements of Optimum Noise Parameters of Microwave Transistors

  • Author

    Martines, Giovanni ; Sannino, Mario

  • Author_Institution
    Dipartimento di Ingegneria Elettrica - Universitá, di Palermo - Viale delle Scienze, 90128 Palermo, Italy.
  • fYear
    1985
  • fDate
    9-13 Sept. 1985
  • Firstpage
    471
  • Lastpage
    476
  • Abstract
    A method for measuring losses of the tuner network used as noise source admittance transformer in transistor noise parameter test-set is presented. Since the method is based on noise figure measurements, tuner losses can be determined on-line while performing measurements for determining transistor noise parameters. As experimental verifications the optimum noise parameters of a GaAs FET in the 4 - 12 GHz frequency range, measured through a computer-assisted measuring system, are reported.
  • Keywords
    Admittance measurement; Frequency measurement; Loss measurement; Microwave FETs; Microwave measurements; Microwave theory and techniques; Microwave transistors; Noise figure; Noise measurement; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1985. 15th European
  • Conference_Location
    Paris, France
  • Type

    conf

  • DOI
    10.1109/EUMA.1985.333523
  • Filename
    4132211
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992856