Evaluation of neutron-induced soft error effects on CPUs in automotive microcontrollers

Author

Uezono, Takumi ; Yoneki, Shinya ; Toba, Tadanobu ; Shimbo, Ken-ichi ; Ibe, Eishi

Author_Institution

Yokohama Res. Lab., Hitachi Ltd., Yokohama, Japan

fYear

2013

fDate

23-27 Sept. 2013

Firstpage

1

Lastpage

4

Abstract

In this study, four types of microcontrollers (MCUs) operating under actual operating conditions, in which MCUs are regularly reset, are irradiated with white and quasi-monoenergetic neutron beams using our newly developed dynamic irradiation test environment. The results of the irradiation tests have good agreement, and show that neutron-induced soft error rates of the MCUs are almost the same, and are within the range of 0.1 to 0.2 FIT. Using the acquired data, the correlation between the characteristics of the running software and the number of soft errors are also analyzed.

Keywords

automotive electronics; integrated circuit testing; microcontrollers; neutron beams; radiation hardening (electronics); CPU; actual operating conditions; automotive microcontrollers; dynamic irradiation test environment; neutron-induced soft error effects; quasimonoenergetic neutron beams; running software characteristics; white monoenergetic neutron beams; Automotive engineering; Benchmark testing; Error correction codes; Neutrons; Particle beams; Radiation effects; Registers;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on

Conference_Location

Oxford

Type

conf

DOI

10.1109/RADECS.2013.6937418

Filename

6937418