Title :
Channel capacity and soft-decision decoding of LDPC codes for spin-torque transfer magnetic random access memory (STT-MRAM)
Author :
Kui Cai ; Zhiliang Qin ; Bingjin Chen
Author_Institution :
Data Storage Inst., Agency for Sci., Technol., & Res. (A*STAR), Singapore, Singapore
Abstract :
Spin-torque transfer magnetic random access memory (STT-MRAM) has emerged as a promising non-volatile memory (NVM) technology, featuring compelling advantages in scalability, speed, endurance, and power consumption. In this paper, we focus on large-capacity stand-alone STT-MRAM, and investigate the channel capacity and the viability of applying low-density parity-check (LDPC) codes with soft-decision decoding to correct the memory cell errors and improve the storage density of STT-MRAM. We propose to use LDPC codes with short codeword lengths, with the reliability-based min-sum (RB-MS) algorithm for decoding. Furthermore, we propose to use the capacity-maximization criterion to design the quantizer and minimize the number of quantization bits. Simulation results demonstrate the potential of applying short-block-length LDPC codes with soft-decision decoding to improve the yield and push the scaling limitation of STT-MRAM.
Keywords :
MRAM devices; block codes; decoding; integrated circuit reliability; parity check codes; LDPC codes; NVM technology; RB-MS algorithm; capacity-maximization criterion; channel capacity; endurance; low-density parity-check codes; memory cell errors; nonvolatile memory technology; power consumption; quantization bits; quantizer design; reliability-based min-sum algorithm; scalability; short codeword lengths; short-block-length codes; soft-decision decoding; speed; spin-torque transfer magnetic random access memory; stand-alone STT-MRAM; storage density improvement; Bit error rate; Channel capacity; Decoding; Magnetic tunneling; Parity check codes; Quantization (signal); Resistance;
Conference_Titel :
Computing, Networking and Communications (ICNC), 2013 International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-5287-1
Electronic_ISBN :
978-1-4673-5286-4
DOI :
10.1109/ICCNC.2013.6504145