Title :
Long term destructive SEE risk and calculations using multiple “worst-case” events vs modelling
Author :
Jiggens, Piers ; Evans, Hugh ; Truscott, Pete ; Heynderickx, Daniel ; Lei, Fan ; DeDonder, Erwin
Author_Institution :
Space Environ. & Effects Sect., Eur. Space Res. & Technol. Centre, Noordwijk, Netherlands
Abstract :
A statistical analysis comparing the number of CREME-96 worst-week environments [1] to a space environment particle flux data analysis and the PSYCHIC model [2] is presented. This analysis provides an indication of the number of worst-week environments that are required to obtain a particular confidence level and determine the associated risk of a destructive single event effect over a mission. A direct assessment of SEE rate specific for components and shielding geometries using the ESA SEPEM system [3] is also presented.
Keywords :
galactic cosmic rays; radiation hardening (electronics); statistical analysis; CREME-96 worst-week environments; ESA SEPEM system; PSYCHIC model; SEE rate; confidence level; destructive single event effect; direct assessment; long-term destructive SEE risk; shielding geometries; space environment particle flux data analysis; statistical analysis; Analytical models; Data models; Geometry; Interplanetary; Ionization; Protons; Time series analysis;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937424
