DocumentCode :
1993145
Title :
Generating Method of Pair-Wise Covering Test Data Based on ACO
Author :
Li, Kewen ; Yang, Zhixia
Author_Institution :
Sch. of Manage., Tianjin Univ., Tianjin
Volume :
2
fYear :
2008
fDate :
21-22 Dec. 2008
Firstpage :
776
Lastpage :
779
Abstract :
Optimizing test suite can reduce the cost of time and resources, and improve the efficiency of regression test when test cases are generated. The generation of pair-wise covering test data is an NP question, which can be solved by heuristic method, greedy arithmetic and algebra method at present. In this paper, ant colony arithmetic is adopted, which is a new way to solve the pair-wise test data generating question. It can generate fewer test cases which can cover more pair combinations,and can solve questions with fast calculate speed. The method can get the goal of optimizing in the process of regression test. The result shows that the method is feasible.
Keywords :
computational complexity; optimisation; program testing; regression analysis; NP question; algebra method; ant colony arithmetic; greedy arithmetic; heuristic method; pairwise covering test data; regression test; test cases; Algebra; Ant colony optimization; Arithmetic; Computer science education; Cost function; Educational technology; Geoscience and remote sensing; Hardware; Management training; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Education Technology and Training, 2008. and 2008 International Workshop on Geoscience and Remote Sensing. ETT and GRS 2008. International Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3563-0
Type :
conf
DOI :
10.1109/ETTandGRS.2008.358
Filename :
5070476
Link To Document :
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