Title :
Degree of Parallelism variations effects on GPUs reliability
Author :
Rech, P. ; Frost, Christopher ; Carro, Luigi
Author_Institution :
Inst. de Inf., Fed. Univ. of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
Results of an extensive neutron radiation test to evaluate the Degree of Parallelism effects on GPUs reliability are presented. Experimental data demonstrate that a higher Degree of Parallelism increases the device performances but may have the countermeasure of making the GPU less reliable to radiation. Architectural analyses highlight that the observed phenomena is due to the increased scheduling strain required to implement the parallelism. Finally, the cache distribution forced by different Degrees Of Parallelism is also proved to influence the application error rate.
Keywords :
graphics processing units; integrated circuit reliability; neutron effects; GPU reliability; application error rate; architectural analysis; neutron radiation test; parallelism variations effects; scheduling strain; Complexity theory; Graphics processing units; Instruction sets; Neutrons; Parallel processing; Reliability; Throughput; Degree Of Parallelism; GPU; Reliability; neutron sensitivity;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937430