Title :
NAND flash memory in-flight data from PROBA-II spacecraft
Author :
D´Alessio, M. ; Poivey, C. ; Walter, Dennis ; Gruermann, K. ; Gliem, F. ; Schmidt, Heidemarie ; Sorensen, R. Harboe ; Keating, Ana ; Fleurinck, N. ; Puimege, K. ; Gerrits, D. ; Mathijs, P.
Author_Institution :
Eur. Space Agency, ESTEC, Noordwijk, Netherlands
Abstract :
This paper presents an analysis of SEE in-flight data on NAND flash memories on-board Technology Demonstration Module (TDM) flying on PROBA-II spacecraft. Proba-II spacecraft has been flying for more than 3 years on a LEO orbit. Observed in-flight error rates are compared with predictions based on ground test data.
Keywords :
NAND circuits; flash memories; radiation hardening (electronics); space vehicle electronics; LEO orbit; NAND flash memory; PROBA-II spacecraft; SEI; SEU; single event effects; technology demonstration module; Flash memories; Monitoring; Protons; Reed-Solomon codes; Space vehicles; Temperature sensors; Time division multiplexing; Flash memory; SEU/SEL; Single Event Effects; hardness assurance; radiation experiment; radiation monitor; technology demonstration;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937432
