DocumentCode :
19935
Title :
Graphene and Lateral Heterostructure for THz Imaging
Author :
Jeong-Sun Moon ; Hwa-Chang Seo ; Baohua Yang ; Antcliffe, Mike ; Kyung-Ah Son ; Wong, Danny ; Schmitz, Adele ; Fung, Helen ; Le, Dustin ; McGuire, Chuck ; Jong-Chan Kang ; Song, Hyok J.
Author_Institution :
HRL Labs. LLC, Malibu, CA, USA
Volume :
5
Issue :
3
fYear :
2015
fDate :
May-15
Firstpage :
344
Lastpage :
350
Abstract :
We report millimeter-wave and sub-terahertz detection using graphene FETs up to 220 GHz at zero-bias to reduce 1/f noise. Detection leveraged the nonlinearity of the channel resistance through resistive field-effect transistor mixing for high-dynamic range. At a 50-Ω load, measured detection responsivity was 70 V/W at 2 GHz to 33 V/W at 110 GHz. The measured noise power of the graphene FETs was ~7.5 ×10-18 V2/Hz at zero-bias. Noise equivalent power at 110 GHz was estimated to be ~80 pW/Hz0.5. A linear dynamic range of > 40 dB was measured, providing 15-20 dB greater linear dynamic range compared to conventional CMOS detectors at the transistor level. The emerging graphene heterostructure diodes offer the RC limited cutoff frequency (fc) of 2.9 THz with the noise equivalent power of ~ 8 pW/Hz0.5 at 200 GHz due to its small junction-capacitance and diode nonlinearity.
Keywords :
field effect transistors; graphene; graphene devices; millimetre wave detectors; terahertz wave imaging; 1/f noise; C; CMOS detectors; RC limited cutoff frequency; channel resistance nonlinearity; detection responsivity; diode nonlinearity; frequency 110 GHz; frequency 2 GHz; frequency 2.9 THz; frequency 200 GHz; graphene FET; graphene heterostructure diodes; lateral heterostructure; linear dynamic; millimeter-wave detection; noise equivalent power; resistance 50 ohm; resistive field-effect transistor mixing; small junction-capacitance; subterahertz detection; terahertz imaging; transistor level; Detectors; Field effect transistors; Graphene; Logic gates; Radio frequency; Resistance; Voltage measurement; Graphene; THz; detectors; heterostructure; radiometers; transistors;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2015.2414297
Filename :
7081789
Link To Document :
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