Title :
Analysis in the frame of space radiation hardness assurance of low dose rate results obtained with MIL and ESCC test method
Author :
Marec, R. ; Carlotti, J.F. ; Marin, Mario ; Calvel, P. ; Barillot, C. ; Mancini, R. ; Sarno, M. ; Melotte, M. ; Cueto, J.
Author_Institution :
Thales Alenia Space, Toulouse, France
Abstract :
We present results on the effects of ELDRS at dose rates in the range of the 10-100 mrad(Si)/s corresponding to low dose rate window of Test Method ESCC Basic Specification No. 22900 in comparison with 10 mrad(Si)/s as required by the MIL-STD-883H, Test Method 1019.8 on different space qualified bipolar part types. The difference on the results are analysed in the frame of the standard Thales Alenia Space Radiation Hardness Assurance applied for telecom space program.
Keywords :
radiation hardening (electronics); ELDRS; ESCC; MIL-STD-883H; No. 22900; Thales Alenia space radiation hardness assurance; telecom space program; Degradation; Integrated circuits; Military standards; Radiation effects; Sensitivity; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937454
