• DocumentCode
    1994309
  • Title

    Software test selection patterns and elusive bugs

  • Author

    Howden, W.E.

  • Author_Institution
    CSE, UCSD, San Diego, CA, USA
  • Volume
    2
  • fYear
    2005
  • fDate
    26-28 July 2005
  • Firstpage
    25
  • Abstract
    Traditional white and black box testing methods are effective in revealing many kinds of defects, but the more elusive bugs slip past them. Model-based testing incorporates additional application concepts in the selection of tests, which may provide more refined bug detection, but does not go far enough. Test selection patterns identify defect-oriented contexts in a program. They also identify suggested tests for risks associated with a specified context. A context and its risks is a kind of conceptual trap designed to corner a bug. The suggested tests will find the bug if it has been caught in the trap.
  • Keywords
    formal specification; object-oriented programming; program debugging; program testing; program verification; black box testing; conceptual trap; model-based testing incorporates; program defect-oriented contexts; software bug detection; software defects; software test selection patterns; white box testing; Binary codes; Computer industry; Hardware; Image analysis; Information analysis; Instruments; Internet; Java; Mobile handsets; Software safety;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference, 2005. COMPSAC 2005. 29th Annual International
  • ISSN
    0730-3157
  • Print_ISBN
    0-7695-2413-3
  • Type

    conf

  • DOI
    10.1109/COMPSAC.2005.122
  • Filename
    1508074