DocumentCode
1994309
Title
Software test selection patterns and elusive bugs
Author
Howden, W.E.
Author_Institution
CSE, UCSD, San Diego, CA, USA
Volume
2
fYear
2005
fDate
26-28 July 2005
Firstpage
25
Abstract
Traditional white and black box testing methods are effective in revealing many kinds of defects, but the more elusive bugs slip past them. Model-based testing incorporates additional application concepts in the selection of tests, which may provide more refined bug detection, but does not go far enough. Test selection patterns identify defect-oriented contexts in a program. They also identify suggested tests for risks associated with a specified context. A context and its risks is a kind of conceptual trap designed to corner a bug. The suggested tests will find the bug if it has been caught in the trap.
Keywords
formal specification; object-oriented programming; program debugging; program testing; program verification; black box testing; conceptual trap; model-based testing incorporates; program defect-oriented contexts; software bug detection; software defects; software test selection patterns; white box testing; Binary codes; Computer industry; Hardware; Image analysis; Information analysis; Instruments; Internet; Java; Mobile handsets; Software safety;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Software and Applications Conference, 2005. COMPSAC 2005. 29th Annual International
ISSN
0730-3157
Print_ISBN
0-7695-2413-3
Type
conf
DOI
10.1109/COMPSAC.2005.122
Filename
1508074
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