• DocumentCode
    1994595
  • Title

    WISE: Automated test generation for worst-case complexity

  • Author

    Burnim, Jacob ; Juvekar, Sudeep ; Sen, Koushik

  • Author_Institution
    EECS Dept., UC Berkeley, Berkeley, CA
  • fYear
    2009
  • fDate
    16-24 May 2009
  • Firstpage
    463
  • Lastpage
    473
  • Abstract
    Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to find performance bugs. Our complexity testing algorithm, which we call WISE (worst-case inputs from symbolic execution), operates on a program accepting inputs of arbitrary size. For each input size, WISE attempts to construct an input which exhibits the worst-case computational complexity of the program. WISE uses exhaustive test generation for small input sizes and generalizes the result of executing the program on those inputs into an ldquoinput generator.rdquo The generator is subsequently used to efficiently generate worst-case inputs for larger input sizes. We have performed experiments to demonstrate the utility of our approach on a set of standard data structures and algorithms. Our results show that WISE can effectively generate worst-case inputs for several of these benchmarks.
  • Keywords
    computational complexity; program debugging; program testing; WISE; automated test generation; complexity testing; correctness bugs; performance bugs; program analysis; symbolic execution; worst-case computational complexity; worst-case inputs; Algorithm design and analysis; Automatic testing; Benchmark testing; Computational complexity; Computer bugs; Data structures; Jacobian matrices; Performance analysis; Performance evaluation; Programming profession;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering, 2009. ICSE 2009. IEEE 31st International Conference on
  • Conference_Location
    Vancouver, BC
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4244-3453-4
  • Type

    conf

  • DOI
    10.1109/ICSE.2009.5070545
  • Filename
    5070545