DocumentCode
1994595
Title
WISE: Automated test generation for worst-case complexity
Author
Burnim, Jacob ; Juvekar, Sudeep ; Sen, Koushik
Author_Institution
EECS Dept., UC Berkeley, Berkeley, CA
fYear
2009
fDate
16-24 May 2009
Firstpage
463
Lastpage
473
Abstract
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to find performance bugs. Our complexity testing algorithm, which we call WISE (worst-case inputs from symbolic execution), operates on a program accepting inputs of arbitrary size. For each input size, WISE attempts to construct an input which exhibits the worst-case computational complexity of the program. WISE uses exhaustive test generation for small input sizes and generalizes the result of executing the program on those inputs into an ldquoinput generator.rdquo The generator is subsequently used to efficiently generate worst-case inputs for larger input sizes. We have performed experiments to demonstrate the utility of our approach on a set of standard data structures and algorithms. Our results show that WISE can effectively generate worst-case inputs for several of these benchmarks.
Keywords
computational complexity; program debugging; program testing; WISE; automated test generation; complexity testing; correctness bugs; performance bugs; program analysis; symbolic execution; worst-case computational complexity; worst-case inputs; Algorithm design and analysis; Automatic testing; Benchmark testing; Computational complexity; Computer bugs; Data structures; Jacobian matrices; Performance analysis; Performance evaluation; Programming profession;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering, 2009. ICSE 2009. IEEE 31st International Conference on
Conference_Location
Vancouver, BC
ISSN
0270-5257
Print_ISBN
978-1-4244-3453-4
Type
conf
DOI
10.1109/ICSE.2009.5070545
Filename
5070545
Link To Document