• DocumentCode
    19946
  • Title

    Interferometric Phase Denoising by Pyramid Nonlocal Means Filter

  • Author

    Runpu Chen ; Weidong Yu ; Wang, Ruiqi ; Gang Liu ; Yunfeng Shao

  • Author_Institution
    Dept. of Space Microwave Remote Sensing Syst., Inst. of Electron., Beijing, China
  • Volume
    10
  • Issue
    4
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    826
  • Lastpage
    830
  • Abstract
    Interferometric phase denoising is a crucial step of interferometric synthetic aperture radar processing flow because it has significant influence on the following steps. Traditional interferometric phase denoising algorithms have a similar drawback that they will wipe off some texture details in phase images while denoising. Nonlocal (NL) means filter, in contrast, can reach a balance between denoising and texture preserving because it utilizes the feature of recursive structures in the whole image. Taking the characteristics of interferometric phase image into consideration, this letter proposes a modified NL means filter algorithm for phase denoising. Moreover, in order to preserve texture to the biggest extent, an iterative algorithm is invented. In the end, experiments on synthetic and real data validate that this algorithm outperforms other traditional denoising methods.
  • Keywords
    filtering theory; image denoising; image texture; iterative methods; radar imaging; radar interferometry; synthetic aperture radar; interferometric phase denoising algorithms; interferometric phase image; interferometric synthetic aperture radar processing; iterative algorithm; modified NL mean filter algorithm; pyramid nonlocal mean filter; recursive structures; texture preserving; Estimation error; Interferometry; Iterative methods; Noise; Noise reduction; Remote sensing; Synthetic aperture radar; Image denoising; interferogram; interferometric synthetic aperture radar (InSAR); nonlocal (NL);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2012.2225594
  • Filename
    6415986