Title :
Ultra-low power current-based PUF
Author :
Majzoobi, Mehrdad ; Ghiaasi, Golsa ; Koushanfar, Farinaz ; Nassif, Sani R.
Author_Institution :
Electr. & Comput. Eng. Dept., Rice Univ. Houston, Houston, TX, USA
Abstract :
In this paper, the first class of low power current-based physically unclonable functions (PUFs) is introduced. The new PUF circuit is able to convert the analog variations present in device leakage currents to a unique digital quantity at high speed and low power. Robust digital responses are achieved with the new architecture in presence of fluctuations in operational conditions such as temperature and supply voltage. The experimental results suggest 3% response error rate under extreme temperature variations from -55°C to 125°C and 20% fluctuations in supply voltage. The PUF consumes 150 μWatt for a duration of 250 ps per each response bit (37.5 femto joules of energy per response bit).
Keywords :
integrated circuit modelling; leakage currents; low-power electronics; device leakage currents; error rate; physically unclonable functions; ultra low power current based PUF; unique digital quantity; Computational modeling; Cryptography; Generators; Robustness; Switches;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5938005