Tapered-VTH CMOS buffer design for improved energy efficiency in deep nanometer technology

In this paper, the novel "tapered-Vth" approach to design energy-efficient CMOS buffers is introduced. In this approach, the substantial energy consumption due to leakage is reduced by tapering the threshold voltage throughout the buffer stages, other than tapering the transistor size. More specifically, the threshold voltage is progressively reduced when going from the last to the first stage. This enables a considerable leakage reduction in the last stages (which contribute most to the overall leakage) at the price of a higher delay. The resulting delay penalty is then compensated by reducing the transistor threshold voltage in the first stages, with an insignificant leakage increase (they contribute very little to the overall buffer leakage). Simulation results based on a commercial 45-nm 1-V CMOS technology show that the proposed "tapered-V_TH" approach can considerably improve the energy efficiency of CMOS buffers over the entire spectrum of possible energy-delay tradeoffs, from high speed to low power.