DocumentCode :
1996426
Title :
3D monolithic integration
Author :
Batude, P. ; Vinet, M. ; Pouydebasque, A. ; Royer, C. Le ; Previtali, B. ; Tabone, C. ; Hartmann, J. -M ; Sanchez, L. ; Baud, L. ; Carron, V. ; Toffoli, A. ; Allain, F. ; Mazzocchi, V. ; Lafond, D. ; Deleonibus, S. ; Faynot, O.
Author_Institution :
Leti, CEA, Grenoble, France
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
2233
Lastpage :
2236
Abstract :
3D monolithic integration, thanks to its high vertical density of interconnections, is the only available option for applications requiring connections at the transistor scale. However to achieve 3D monolithic integration, some issues such as realization of high quality top film, high stability bottom FET, low thermal budget top FET still have to be solved. In this work, a 3D monolithic process flow relying on molecular wafer bonding is proposed and results in all critical steps are given. Significant breakthroughs have been obtained using a full wafer molecular bonding with thin interlayer dielectric and an original salicidation process stabilized up to 650°C enabling to reach high performance for the top and bottom transistor. With such technology, we demonstrate functional top and bottom transistors as well as 3D structures such as invertors and SRAMs.
Keywords :
SRAM chips; integrated circuit bonding; invertors; three-dimensional integrated circuits; transistors; 3D monolithic integration; 3D monolithic process flow; 3D structures; SRAM; bottom transistor; full wafer molecular bonding; invertors; molecular wafer bonding; salicidation process; thin interlayer dielectric; top transistor; Bonding; FETs; Logic gates; Monolithic integrated circuits; Silicon; Three dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
ISSN :
0271-4302
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
Type :
conf
DOI :
10.1109/ISCAS.2011.5938045
Filename :
5938045
Link To Document :
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