DocumentCode :
1996639
Title :
Germanium orthogonal strip detectors with amorphous-semiconductor contacts
Author :
Luke, P.N. ; Amman, M. ; Phlips, Bernard F. ; Johnson, W.N. ; Koreger, R.A.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
201
Abstract :
Germanium orthogonal strip detectors have been produced using amorphous-semiconductor contacts. The amorphous-semiconductor contact fabrication process is relatively simple, and it is capable of producing fine-pitched electrode structures. The bipolar blocking behavior of the amorphous-semiconductor contact permits its use on both sides of a detector, replacing conventional B ion implanted and Li diffused contacts. A 5×5 orthogonal strip detector has been produced using this technique. Experimental results from this detector are presented
Keywords :
amorphous semiconductors; electrical contacts; germanium radiation detectors; semiconductor junctions; Ge; Ge orthogonal strip detectors; amorphous-semiconductor contacts; bipolar blocking; Amorphous materials; Contacts; Detectors; Electrodes; Energy resolution; Fabrication; Germanium; Laboratories; Spatial resolution; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
ISSN :
1082-3654
Print_ISBN :
0-7803-5696-9
Type :
conf
DOI :
10.1109/NSSMIC.1999.842475
Filename :
842475
Link To Document :
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