• DocumentCode
    1996639
  • Title

    Germanium orthogonal strip detectors with amorphous-semiconductor contacts

  • Author

    Luke, P.N. ; Amman, M. ; Phlips, Bernard F. ; Johnson, W.N. ; Koreger, R.A.

  • Author_Institution
    Lawrence Berkeley Lab., CA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    201
  • Abstract
    Germanium orthogonal strip detectors have been produced using amorphous-semiconductor contacts. The amorphous-semiconductor contact fabrication process is relatively simple, and it is capable of producing fine-pitched electrode structures. The bipolar blocking behavior of the amorphous-semiconductor contact permits its use on both sides of a detector, replacing conventional B ion implanted and Li diffused contacts. A 5×5 orthogonal strip detector has been produced using this technique. Experimental results from this detector are presented
  • Keywords
    amorphous semiconductors; electrical contacts; germanium radiation detectors; semiconductor junctions; Ge; Ge orthogonal strip detectors; amorphous-semiconductor contacts; bipolar blocking; Amorphous materials; Contacts; Detectors; Electrodes; Energy resolution; Fabrication; Germanium; Laboratories; Spatial resolution; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5696-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1999.842475
  • Filename
    842475