• DocumentCode
    1996694
  • Title

    Characteristics of thin film piezoelectric ultrasonic transducer array by chemical solution deposition

  • Author

    Palosaari, J. ; Juuti, J. ; Tyholdt, F. ; stbo, N.P. ; Vogl, A. ; Poppe, E. ; Guðbjörnsson, S. ; Ringgaard, E. ; Hök, B. ; Fägerman, P.E. ; Glersen, P. ; Ræder, H. ; Jantunen, H.

  • Author_Institution
    Microelectron. & Mater. Phys. Labs., Univ. of Oulu, Oulu, Finland
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    1734
  • Lastpage
    1737
  • Abstract
    In this paper, thin film piezoelectric ultrasonic transducers with a two electrode design and various different membrane sizes were manufactured and characterized. The transducers were fabricated on a silicon wafer by chemical solution deposition (CSD) where PZT was deposited with a total thickness of ~2 ¿m. Afterwards, cavities were wet etched underneath the piezoelectric layer creating bending membranes with a total thickness of ~13 ¿m and cavity sizes from 0.056 mm2 to 0.181 mm2. Then the transducers were poled and their electromechanical properties were measured with laser vibrometer. The membranes resonance frequencies and quality factors were measured at ~780-2000 kHz and 70-135, respectively, and effective d33 coefficients from 100-290 nm/V.
  • Keywords
    Q-factor; etching; lead compounds; liquid phase deposition; membranes; piezoelectric thin films; piezoelectric transducers; ultrasonic transducer arrays; PZT; bending membrane; cavity size; chemical solution deposition; electromechanical properties; laser vibrometer; membrane size; quality factor; resonance frequency; thin film piezoelectric ultrasonic transducer array; two electrode design; wet etching; Biomembranes; Chemical transducers; Electrodes; Piezoelectric films; Piezoelectric transducers; Pulp manufacturing; Silicon; Sputtering; Ultrasonic transducer arrays; Ultrasonic transducers; CSD; piezoelectric; transducer; ultrasonic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441653
  • Filename
    5441653