DocumentCode
1996939
Title
Measurements of acoustic properties of ZnO single crystals by the LFB/PW ultrasonic material characterization system
Author
Kourai, Y. ; Yoshida, Sigeru ; Ohashi, Yoshimasa ; Arakawa, Mototaka ; Kushibiki, Jun-ichi ; Sakagami, Norimitsu
Author_Institution
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
1169
Lastpage
1172
Abstract
We evaluated the resistivities of a Z-cut ZnO single crystal plate specimen by measuring longitudinal-wave propagation characteristics (velocity and attenuation) in frequencies from 50 MHz to 1.5 GHz and also leaky surface acoustic wave (LSAW) velocities (VLSAW) on the specimen surfaces at 225 MHz using a line-focus-beam/plane-wave (LFB/PW) ultrasonic material characterization (UMC) system. A slight decrease of VLSAW was observed on -Z-plane of the specimen initially prepared in comparison with VLSAW on the +Z surface. The corresponding Z-axis longitudinal-wave propagation characteristics exhibited significant velocity dispersion and frequency dependence of attenuation associated with relatively low resistivity. For the specimen by removing the -Z side surface by about 0.5-mm thickness, we observed the same high VLSAW on both the ±Z surfaces. We could estimate the resistivities of 1·104 ¿m for the specimen after removal of the 0.5-mm thick layer and 30 ¿m to 1·104 ¿m distributed for the removed layer. This approach will contribute to establish our resistivity evaluation method using the LSAW propagation characteristics.
Keywords
II-VI semiconductors; electrical resistivity; surface acoustic waves; ultrasonic dispersion; ultrasonic materials testing; ultrasonic velocity; wide band gap semiconductors; zinc compounds; ZnO; acoustic properties; acoustic wave dispersion; frequency 50 MHz to 1.5 GHz; leaky surface acoustic wave velocity; line-focus-beam characterization; longitudinal-wave propagation; plane-wave characterization; resistivity; ultrasonic material characterization; Acoustic materials; Acoustic measurements; Attenuation measurement; Conductivity; Crystalline materials; Crystals; Frequency measurement; Surface acoustic waves; Ultrasonic variables measurement; Zinc oxide; ZnO single crystal; attenuation coefficient; dielectric relaxation; leaky surface acoustic wave velocity; line-focus-beam / plane-wave ultrasonic material characterization system; longitudinal wave velocity; resistivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441664
Filename
5441664
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