Title :
G2Way A Backtracking Strategy for Pairwise Test Data Generation
Author :
Klaib, Mohammad F J ; Zamli, Kamal Z. ; Isa, Nor Ashidi M ; Younis, Mohammed I. ; Abdullah, Rusli
Author_Institution :
Sch. of Electr. & Electron., Univ. Sains Malaysia, Nibong Tebal
Abstract :
Our continuous dependencies on software (i.e. to assist as well as facilitate our daily chores) often raise dependability issue particularly when software is being employed harsh and life threatening or (safety) critical applications. Here, rigorous software testing becomes immensely important. Many combinations of possible input parameters, hardware/software environments, and system conditions need to be tested and verified against for conformance. Due to resource constraints as well as time and costing factors, considering all exhaustive test possibilities would be impossible (i.e. due to combinatorial explosion problem). Earlier work suggests that pairwise sampling strategy (i.e. based on two-way parameter interaction) can be effective. Building and complementing earlier work, this paper discusses an efficient pairwise test data generation strategy, called G2Way. In doing so, this paper demonstrates the correctness of G2Way as well as compares its effectiveness against existing strategies including AETG and its variations, IPO, SA, GA, ACA, and All Pairs. Empirical evidences demonstrate that G2Way, in some cases, outperformed other strategies in terms of the number of generated test data within reasonable execution time.
Keywords :
automatic test pattern generation; program testing; G2Way; backtracking strategy; pairwise sampling strategy; pairwise test data generation; resource constraints; software testing; Application software; Computer science; Control systems; Electronic equipment testing; Explosions; Hardware; Software safety; Software systems; Software testing; System testing; combinatorial software testing; pairwise testing;
Conference_Titel :
Software Engineering Conference, 2008. APSEC '08. 15th Asia-Pacific
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-3446-6
DOI :
10.1109/APSEC.2008.49