X-ray detection characteristics of thallium bromide nuclear radiation detectors

Author

Hitomi, K. ; Muroi, O. ; Matsumoto, M. ; Hirabuki, R. ; Shoji, T. ; Hiratate, Y.

Author_Institution

Dept. of Electron., Tohoku Inst. of Technol., Sendai, Japan

Volume

1

fYear

1999

fDate

1999

Firstpage

339

Abstract

Semiconductor X-ray detectors have been fabricated from high purity TlBr crystals grown by the traveling molten zone method. X-ray detection characteristics of the TlBr detectors in the individual quantum pulse mode as well as in the current mode have been studied. An energy resolution of 2.5 keV FWHM has been recorded for 22 keV X-rays with a TlBr detector operated in the individual quantum pulse mode at room temperature. The TlBr detectors in the current mode have been tested as flux detectors for an X-ray CT scanner system of a first generation type. The performance of the system has been tested using a wooden phantom. The X-ray CT system has shown good imaging capabilities

Keywords

X-ray detection; computerised tomography; diagnostic radiography; semiconductor counters; thallium compounds; 22 keV; TlBr; X-ray CT scanner system; X-ray detection characteristics; energy resolution; high purity TlBr crystals; individual quantum pulse mode; semiconductor X-ray detectors; thallium bromide nuclear radiation detectors; traveling molten zone method; wooden phantom; Computed tomography; Crystals; Energy resolution; Imaging phantoms; Optical imaging; System testing; Temperature; X-ray detection; X-ray detectors; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE

Conference_Location

Seattle, WA

ISSN

1082-3654

Print_ISBN

0-7803-5696-9

Type

conf

DOI

10.1109/NSSMIC.1999.842504

Filename

842504