• DocumentCode
    1997388
  • Title

    Stacked crystal resonator: A highly linear BAW device

  • Author

    Handtmann, Martin ; Gebauer, Bernhard ; Franosch, Martin ; Mutamba, Kabula

  • Author_Institution
    Wireless Semicond. Div., AVAGO Technol., Munich, Germany
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    889
  • Lastpage
    892
  • Abstract
    Besides small size, exceptional insertion loss and outstanding isolation, bulk acoustic wave (BAW) filters and duplexers are often the preferred choice in the transmit path of mobile frontend due to their excellent power handling capabilities. However, they exhibit a nonlinear behavior, causing generation of higher harmonics and a sensitivity of the resonance frequency towards a DC voltage bias. In this paper we present a new BAW device, a stacked crystal resonator (SCR), which intrinsically cancels out the second order nonlinearity and compare it to standard BAW resonators and current solutions for improved linearity. Measurements of first devices demonstrate a 30 dB improvement in worst case second order harmonic generation of a SCR over a standard BAW solid mounted resonator. Furthermore, the frequency sensitivity on a DC voltage bias is reduced by a factor of 20 and the coupling coefficient increased by 10%.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; crystal resonators; harmonic generation; stack filters; bulk acoustic wave duplexers; bulk acoustic wave filters; higher harmonic generation; insertion loss; isolation; linear BAW device; mobile front-end; power handling capability; second order harmonic generation; second order nonlinearity; stacked crystal resonator; Acoustic waves; Bulk acoustic wave devices; DC generators; Insertion loss; Power harmonic filters; Propagation losses; Resonant frequency; Resonator filters; Thyristors; Voltage; BAW; Bulk acoustic wave resonator; SCR; nonlinearity; stacked crystal resonator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441683
  • Filename
    5441683