Title :
A Five-Port Reflectometer using a Three Probes Scheme
Author :
Munoz, J. ; Margineda, J. ; Zamarro, J.M. ; Martin, E.
Author_Institution :
Facultad de Ciencias, Dptp. de Fisica, Universidad de Murcia, 30001 MURCIA (SPAIN)
Abstract :
A five-port automatic reflectometer is presented. The measuring cell consists of three fixed probes on a rectangular waveguide. The system performance is described and a procedure for source matching error correction is proposed and tested. The calibration procedure, unlike for most other reflectometers is very symple and fast.
Keywords :
Calibration; Computer displays; Error correction; Frequency; Microwave measurements; Power measurement; Probes; Rectangular waveguides; Reflection; System testing;
Conference_Titel :
Microwave Conference, 1987. 17th European
Conference_Location :
Rome, Italy
DOI :
10.1109/EUMA.1987.333731
