DocumentCode
1997485
Title
Foreword
fYear
2008
fDate
25-29 May 2008
Abstract
Presents the introductory welcome message from the conference proceedings.
Keywords
Circuit testing; Circuits and systems; Design engineering; Electronic equipment testing; Europe; Power system reliability; Reliability engineering; Semiconductor device reliability; Semiconductor device testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2008 13th European
Conference_Location
Verbania
Print_ISBN
978-0-7695-3150-2
Type
conf
DOI
10.1109/ETS.2008.4
Filename
4556013
Link To Document