Title :
The Loss Analysis of Inset Dielectric Guide Including Bending Loss and a Comparison with Image Line
Author :
Hedges, S. ; Rozzi, T.
Author_Institution :
Marconi Research Laboratories, Chelmsford, Essex, England.
Abstract :
This paper presents the loss analysis of Inset Dielectric Guide (IDG). IDG offers the potential for practical low loss circuits operating at frequencies above 100 GHz. The formulation of the loss components is discussed and the computed loss of a straight section is given and compared with measured values. The measured insertion loss of two 90 degree bends in IDG are presented and finally a theoretical loss comparison with Image and Insular line is given.
Keywords :
Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Diffraction; Frequency; Image analysis; Integral equations; Loss measurement; Moment methods;
Conference_Titel :
Microwave Conference, 1987. 17th European
Conference_Location :
Rome, Italy
DOI :
10.1109/EUMA.1987.333641
