Title :
Characterization of cMUT by Dynamic Holography Microscopy
Author :
Sénégond, Nicolas ; Certon, Dominique ; Bernard, Jean-Edouard ; Teston, Franck
Abstract :
The comparison of numerical simulations to real cMUT behavior is essential to assess and optimize the process. For a complete characterization multiple devices (FIB, SEM, impedancemetry, laser interferometry, ...) are needed. In this context, we propose to use a full-field measurement device, a Digital Holography Microscopy (DHM Lynceetec®), which acquires static and dynamic in-plane and out-of-plane information of membranes population in a single acquisition and then provides most of required parameters. This paper presents the principle of this device, its performances comparing to other ones and its limits.
Keywords :
electric impedance measurement; focused ion beam technology; holography; light interferometry; micromachining; micromechanical devices; scanning electron microscopy; ultrasonic transducers; DHM Lynceetec; FIB; SEM; cMUT; data acquisition; dynamic holography microscopy; full-field measurement device; impedancemetry; laser interferometry; membranes population; Atomic force microscopy; Biomembranes; Holography; Optical interferometry; Scanning electron microscopy; Stress; Testing; Transducers; Voltage; Wavelength measurement; Dynamic Holography Microscope; Young´s modulus membrane; cMUT; initial stress membrane;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441729