DocumentCode :
1998634
Title :
Technological exploration of RRAM crossbar array for matrix-vector multiplication
Author :
Peng Gu ; Boxun Li ; Tianqi Tang ; Shimeng Yu ; Yu Cao ; Yu Wang ; Huazhong Yang
Author_Institution :
Dept. of E.E., Tsinghua Univ., Beijing, China
fYear :
2015
fDate :
19-22 Jan. 2015
Firstpage :
106
Lastpage :
111
Abstract :
The matrix-vector multiplication is the key operation for many computationally intensive algorithms. In recent years, the emerging metal oxide resistive switching random access memory (RRAM) device and RRAM crossbar array have demonstrated a promising hardware realization of the analog matrix-vector multiplication with ultra-high energy efficiency. In this paper, we analyze the impact of nonlinear voltage-current relationship of RRAM devices and the interconnect resistance as well as other crossbar array parameters on the circuit performance and present a design guide. On top of that, we propose a technological exploration flow for device parameter configuration to overcome the impact of nonideal factors and achieve a better trade-off among performance, energy and reliability for each specific application. The simulation results of a support vector machine (SVM) and MNIST pattern recognition dataset show that the RRAM crossbar array-based SVM is robust to the input signal fluctuation but sensitive to the tunneling gap deviation. A further resistance resolution test presents that a 4-bit RRAM device is able to realize a recognition accuracy of ~ 90%, indicating the physical feasibility of RRAM crossbar array-based SVM. In addition, the proposed technological exploration flow is able to achieve 10.98% improvement of recognition accuracy on the MNIST dataset and 26.4% energy savings compared with previous work.
Keywords :
matrix multiplication; resistive RAM; support vector machines; MNIST pattern recognition dataset; RRAM crossbar array-based SVM; analog matrix-vector multiplication; crossbar array parameters; input signal fluctuation; interconnect resistance; metal oxide RRAM device; metal oxide resistive switching random access memory device; nonideal factors; nonlinear voltage-current relationship; resistance resolution test; support vector machine; tunneling gap deviation; Accuracy; Arrays; Integrated circuit interconnections; Performance evaluation; Resistance; Support vector machines; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
978-1-4799-7790-1
Type :
conf
DOI :
10.1109/ASPDAC.2015.7058989
Filename :
7058989
Link To Document :
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