DocumentCode :
1999059
Title :
X-ray Investigation Of Multilayered Semiconductor Heterostructures
Author :
Tapfer, Leander
Author_Institution :
Centro Nazionale Ricerca e Sviluppo Material
fYear :
1992
fDate :
16-19 Nov 1992
Firstpage :
131
Lastpage :
132
Keywords :
Capacitive sensors; Chemicals; Epitaxial layers; Lattices; Optical superlattices; Satellites; Semiconductor materials; Structural engineering; Substrates; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN :
0-7803-0526-4
Type :
conf
DOI :
10.1109/LEOS.1992.693877
Filename :
693877
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1999059
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