DocumentCode :
1999061
Title :
Eigen-frequency and frequency response calculation of piezoelectric resonator parameters
Author :
Yong, Yook-Kong ; Fang, Frank ; Chuang, Shih
Author_Institution :
Rutgers Univ., Piscataway, NJ, USA
fYear :
2009
fDate :
20-23 Sept. 2009
Firstpage :
1078
Lastpage :
1081
Abstract :
Equations for the calculation of the equivalent circuit parameters of the piezoelectric resonator are presented. The results from both eigen-frequency and frequency response analyses could be used for calculating the electrical parameters of the Butterworth Van Dyke model of the piezoelectric resonator. The values of the electrical parameters C1, and L1 obtained from both types of analyses were found to be similar, and were found to compare reasonably well with the measured values of two 12 MHz AT-cut quartz resonators. The values of R1, and Q were less well predicted when the resonator has a lower Q. The static capacitance C0 could be calculated accurately by its frequency response at 1 Hz. The eigen-frequency analysis is better suited than the frequency response analysis for the study of electrode and plate geometry designs, hence the eigen-frequency equations for calculating the equivalent circuit parameters are more useful for parametric designs.
Keywords :
capacitance; crystal resonators; eigenvalues and eigenfunctions; equivalent circuits; frequency response; AT-cut quartz resonators; Butterworth Van Dyke model; eigenfrequency analysis; electrode geometry; equivalent circuit parameters; frequency response calculation; piezoelectric resonator; plate geometry design; static capacitance; Admittance; Bandwidth; Capacitance; Equations; Equivalent circuits; Finite element methods; Frequency response; Levee; Resonance; Resonant frequency; Quartz resonators; eigen-frequency analysis; equivalent electrical parameters; frequency response analysis; piezoelectric resonators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
ISSN :
1948-5719
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
Type :
conf
DOI :
10.1109/ULTSYM.2009.5441753
Filename :
5441753
Link To Document :
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