• DocumentCode
    1999061
  • Title

    Eigen-frequency and frequency response calculation of piezoelectric resonator parameters

  • Author

    Yong, Yook-Kong ; Fang, Frank ; Chuang, Shih

  • Author_Institution
    Rutgers Univ., Piscataway, NJ, USA
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    1078
  • Lastpage
    1081
  • Abstract
    Equations for the calculation of the equivalent circuit parameters of the piezoelectric resonator are presented. The results from both eigen-frequency and frequency response analyses could be used for calculating the electrical parameters of the Butterworth Van Dyke model of the piezoelectric resonator. The values of the electrical parameters C1, and L1 obtained from both types of analyses were found to be similar, and were found to compare reasonably well with the measured values of two 12 MHz AT-cut quartz resonators. The values of R1, and Q were less well predicted when the resonator has a lower Q. The static capacitance C0 could be calculated accurately by its frequency response at 1 Hz. The eigen-frequency analysis is better suited than the frequency response analysis for the study of electrode and plate geometry designs, hence the eigen-frequency equations for calculating the equivalent circuit parameters are more useful for parametric designs.
  • Keywords
    capacitance; crystal resonators; eigenvalues and eigenfunctions; equivalent circuits; frequency response; AT-cut quartz resonators; Butterworth Van Dyke model; eigenfrequency analysis; electrode geometry; equivalent circuit parameters; frequency response calculation; piezoelectric resonator; plate geometry design; static capacitance; Admittance; Bandwidth; Capacitance; Equations; Equivalent circuits; Finite element methods; Frequency response; Levee; Resonance; Resonant frequency; Quartz resonators; eigen-frequency analysis; equivalent electrical parameters; frequency response analysis; piezoelectric resonators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441753
  • Filename
    5441753