DocumentCode :
1999144
Title :
Design methodology for approximate accumulator based on statistical error model
Author :
Chang Liu ; Xinghua Yang ; Fei Qiao ; Qi Wei ; Huazhong Yang
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear :
2015
fDate :
19-22 Jan. 2015
Firstpage :
237
Lastpage :
242
Abstract :
Approximate computing technology has aroused growing interest in circuit and system design for its well-performed trade-off between output quality and performance. Numerous basic circuits and system design methodologies for approximate computing have been proposed. Considering that the existing methodologies for the evaluation of tradeoff between output quality and performance is time-consuming, this paper presents a fast design methodology for approximate accumulator based on statistical error model, in which the inexact multistage speculative adder is adopted and modeled for its advantage of compact error pattern. To validate the proposed methodology, Support Vector Machine(SVM) algorithm is analyzed and mapped to a hardware system composed of inexact and accurate computing circuits. Results show that our time for searching the optimal mapping circuits has been saved by 22.08% than functional-based simulation where the final approximate system design achieves 1.57× speedups with 8.56% accuracy degradation.
Keywords :
adders; approximation theory; circuit simulation; statistical analysis; support vector machines; SVM algorithm; accuracy degradation; approximate accumulator; approximate computing technology; approximate system design; compact error pattern; computing circuit; functional-based simulation; hardware system; multistage speculative adder; optimal mapping circuit; output quality and performance; statistical error model; support vector machine algorithm; system design methodology; well-performed trade-off; Adders; Approximation algorithms; Approximation methods; Computational modeling; Data models; Integrated circuit modeling; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
978-1-4799-7790-1
Type :
conf
DOI :
10.1109/ASPDAC.2015.7059011
Filename :
7059011
Link To Document :
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