Title :
CMOS interface circuits for reading and writing memristor crossbar array
Author :
Qureshi, Muhammad Shakeel ; Pickett, Matthew ; Miao, Feng ; Strachan, John Paul
Author_Institution :
Inf. Quantum Syst. Lab., Hewlett Packard Labs., Palo Alto, CA, USA
Abstract :
This paper describes CMOS interface circuits in 350nm 3.3V/5.0V TSMC process for memristor crossbar array. These circuits are applicable for non-volatile resistive memories. The architecture is targeted for low power and high speed applications. We have demonstrated sense amplifiers for reading the state of a memristor bit. Voltage divider and transimpedence amplifier is used for DC sensing while sigma delta approach is used for averaging. Current limiting write amplifier has also been designed for increasing the device endurance and reliability. Half select array architecture is used to minimize dc leakage current in the crossbar array.
Keywords :
CMOS integrated circuits; amplifiers; integrated circuit reliability; low-power electronics; memristors; random-access storage; voltage dividers; CMOS interface circuits; DC sensing; TSMC process; half select array; high speed applications; low power applications; memristor crossbar array; nonvolatile resistive memories; reliability; sense amplifiers; sigma delta approach; size 350 nm; transimpedence amplifier; voltage 3.3 V; voltage 5.0 V; voltage divider; Arrays; CMOS integrated circuits; Driver circuits; Memristors; Sigma delta modulation; Switches;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5938211