DocumentCode :
2000575
Title :
Mitigating spurious compressional waves in multi-measurand thickness shear mode sensors
Author :
Andle, Jeffrey C. ; Haskell, Reichl ; Chap, Maly ; Stevens, Daniel ; Columbus, Jo ; Gomes, Richard ; Nguyen, Long
Author_Institution :
SenGenuity Div., Vectron Int., Hudson, NH, USA
fYear :
2009
fDate :
20-23 Sept. 2009
Firstpage :
2519
Lastpage :
2524
Abstract :
There is a growing demand for multi-measurand monitoring of fluid properties in industrial settings. A notable example is in the area of fuels, lubricants, hydraulic fluids, and coolants, in which fluid aging and fluid contamination must be monitored and subjected to trend analysis to optimize preventive maintenance schedules. Typically these applications require viscosity measurement for immediate detection of catastrophic failure and employ conductivity and/or dielectric measurements for predictive measurements. The present work investigates unwanted compressional wave interactions in a multi-measurand thickness shear mode coupled resonator sensor, their mitigation, and the potential to employ the interactions to extract density and compressibility modulus information.
Keywords :
compressibility; coolants; flow sensors; fuel; lubricants; viscosity measurement; catastrophic failure; compressibility modulus; conductivity measurement; coolants; dielectric measurement; fluid aging; fluid contamination; fuels; hydraulic fluids; lubricants; multimeasurand thickness shear mode sensor; spurious compressional wave mitigation; viscosity measurement; Aging; Condition monitoring; Conductivity measurement; Contamination; Coolants; Dielectric measurements; Fuels; Lubricants; Pollution measurement; Preventive maintenance; TSM sensor; compressional waves; conductivity-dielectric; density; fluid phase; langasite; multi-measurand;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
ISSN :
1948-5719
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
Type :
conf
DOI :
10.1109/ULTSYM.2009.5441816
Filename :
5441816
Link To Document :
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