• DocumentCode
    2000750
  • Title

    A high temperature ultrafast isolated converter to turn-off normally-on SiC JFETs

  • Author

    Dubois, Fabien ; Sorel, Stéphane ; Dhokkar, Sonia ; Meuret, Régis ; Bergogne, Dominique ; Martin, Christian ; Allard, Bruno ; Morel, Hervé ; Wang, Ruxi

  • Author_Institution
    SAFRAN Power Div., Hispano-Suiza - SAFRAN, Moissy-Cramayel, France
  • fYear
    2012
  • fDate
    15-20 Sept. 2012
  • Firstpage
    3581
  • Lastpage
    3588
  • Abstract
    Silicon Carbide (SiC) components are accepted devices for high temperature and high efficiency applications. Normally-on SiC JFETs are now commercialized and will be used in future power converters. However, such devices are conducting when not driven with a sufficient negative voltage, which can lead to safety issues during start-up or abnormal operation of the gate driver. Therefore, it is needed to generate an auxiliary negative voltage to turn-off the JFET in order to protect the system. Moreover, insulation is necessary to cover all failure modes. Prior papers presented solution to protect such devices but no high temperature isolated solution were demonstrated. In this paper, a solution to protect JFETs used in a high temperature (200°C) voltage source inverter is proposed. The protection circuit, components selection and characterizations for high temperature application are detailed. Experimental results are provided and validate the design of the isolated normally-on protection circuit up to 200°C.
  • Keywords
    failure analysis; high-temperature techniques; invertors; junction gate field effect transistors; power convertors; silicon compounds; wide band gap semiconductors; SiC; abnormal operation; components selection; failure modes; gate driver; high efficiency applications; high temperature application; high temperature applications; high temperature ultrafast isolated power converter; isolated normally-on protection circuit; negative voltage; temperature 200 degC; turn-off normally-on JFET; voltage source inverter; JFETs; Logic gates; Regulators; Silicon carbide; Temperature measurement; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2012 IEEE
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4673-0802-1
  • Electronic_ISBN
    978-1-4673-0801-4
  • Type

    conf

  • DOI
    10.1109/ECCE.2012.6342486
  • Filename
    6342486