DocumentCode
2000933
Title
Investigation of charge trapping in thin Kapton® polyimide films by means of photo-stimulated discharge spectroscopy
Author
Kozhevnikova, Nika ; Gerhard, Reimund ; Mellinger, Axel
Author_Institution
Dept. of Phys. & Astron., Univ. of Potsdam, Potsdam, Germany
fYear
2010
fDate
4-9 July 2010
Firstpage
1
Lastpage
4
Abstract
Photo-stimulated discharge-current spectroscopy was performed on 50 μm Kapton® 200HN polyimide thermo- and photoelectrets formed in the temperature range between -40°C and +130°C. Films were either charged in the DC electric field of 20 MV/m or photo-charged by illumination with light at the wavelength of 420 nm under the electric field of the same strength. Photocurrent spectra scanned in the wavelength interval 600-350 nm demonstrate a pronounced peak at approximately 470 nm revealing the presence of one charge-trapping level. The long-wavelength cut-off of the peak is at 550 nm corresponding to 2.3 eV trap depth.
Keywords
dielectric thin films; electron traps; photoconductivity; photoelectrets; photoemission; polymer films; thermoelectrets; DC electric field; charge trapping; charge-trapping level; photo-stimulated discharge-current spectroscopy; photocurrent spectra; photoelectrets; polyimide thermo-electrects; size 50 mum; temperature -40 C to 130 C; thin Kapton polyimide films; wavelength 420 nm; wavelength 470 nm; wavelength 550 nm; wavelength 600 nm to 350 nm; wavelength interval; Charge carrier processes; Discharges; Films; Lighting; Polyimides; Temperature measurement; Kapton® polyimide; charge-trapping levels; discharge-current spectroscopy; photo-stimulated discharge;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location
Potsdam
Print_ISBN
978-1-4244-7945-0
Electronic_ISBN
978-1-4244-7943-6
Type
conf
DOI
10.1109/ICSD.2010.5567942
Filename
5567942
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