• DocumentCode
    2001111
  • Title

    A Study Of ESD Protection Devices For Input Pins Discharge Characteristics Of Diode, Lateral Bipolar Transistor And Thyristor Under Mm And Hbm Tests

  • Author

    Ishizuka, Hiroyasu ; Okuyama, Kousuke ; Kubota, Katsuhiko ; Komuro, Masamichi ; Hara, Yuuji

  • Author_Institution
    Hitachi Microcomputer System
  • fYear
    1997
  • fDate
    25-25 Sept. 1997
  • Firstpage
    255
  • Lastpage
    262
  • Keywords
    Biological system modeling; Bipolar transistors; Diodes; Electrostatic discharge; Energy consumption; MOSFETs; Pins; Protection; Stress; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    1-878303-69-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.1997.634250
  • Filename
    634250
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2001111