• DocumentCode
    2001605
  • Title

    High-speed resonant gate driver with controlled peak gate voltage for silicon carbide MOSFETs

  • Author

    Anthony, Philip ; McNeill, Neville ; Holliday, Derrick

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK
  • fYear
    2012
  • fDate
    15-20 Sept. 2012
  • Firstpage
    2961
  • Lastpage
    2968
  • Abstract
    Parasitic inductance in the gate path of a Silicon Carbide MOSFET places an upper limit upon the switching speeds achievable from these devices, resulting in unnecessarily high switching losses due to the introduction of damping resistance into the gate path. A method to reduce switching losses is proposed, using a resonant gate driver to absorb parasitic inductance in the gate path, enabling the gate resistor to be removed. The gate voltage is maintained at the desired level using a feedback loop. Experimental results for a 1200 V Silicon Carbide MOSFET gate driver are presented, demonstrating switching loss of 230 μJ at 800 V, 10 A. This represents a 20% reduction in switching losses in comparison to conventional gate drive methods.
  • Keywords
    damping; power MOSFET; silicon compounds; wide band gap semiconductors; SiC; controlled peak gate voltage; conventional gate drive methods; damping resistance; feedback loop; gate path; gate resistor; high switching losses; high-speed resonant gate driver; parasitic inductance; silicon carbide MOSFET; switching speeds; voltage 1200 V; Inductance; Logic gates; MOSFETs; Silicon carbide; Switches; Switching loss; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2012 IEEE
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4673-0802-1
  • Electronic_ISBN
    978-1-4673-0801-4
  • Type

    conf

  • DOI
    10.1109/ECCE.2012.6342520
  • Filename
    6342520