Title :
Measurement of hole mobility in dielectric liquids
Author :
Hirai, N. ; Aril, K. ; Kikuchi, H. ; Masaoka, T. ; Nitanda, H.
Author_Institution :
Fac. of Eng., Ehime Univ., Japan
Abstract :
Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was found that the hole greatly influenced the breakdown of dielectric liquids. The authors report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from a NESA glass electrode into cyclohexane under KrF excimer laser irradiation. The NESA was coated with ITO (indium tin oxide). An analysis of electron and hole mobility is presented
Keywords :
dielectric liquids; KrF excimer laser irradiation; NESA glass electrode; breakdown; cyclohexane; dielectric liquids; electron mobility; hole mobility; needle/plane electrode; Charge carrier processes; Dielectric breakdown; Dielectric liquids; Dielectric measurements; Electrodes; Electron mobility; Glass; Indium tin oxide; Needles; Production;
Conference_Titel :
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location :
Baden-Dattwil
Print_ISBN :
0-7803-0791-7
DOI :
10.1109/ICDL.1993.593921
