• DocumentCode
    2002283
  • Title

    An alternative to polishing the surfaces of scintillation detectors [nuclear medicine application]

  • Author

    Siegel, S. ; Eriksson, M. ; Eriksson, L. ; Casey, M. ; Nutt, R.

  • Author_Institution
    Concorde Microsystems, Knoxville, TN, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1212
  • Abstract
    Experiments have been performed to evaluate the effect of a thin layer of low index of refraction epoxy applied to Lutetium Oxyorthosilicate crystals. Where possible, the results have been compared to chemical polishing/etching. It has been found that there is a significant improvement in energy resolution when cut crystal elements are treated with the epoxy, while the mean light output is unaffected. As the same effects were noted with scintillator blocks as with individual crystal elements, treatment with the low index of refraction epoxy may be of advantage in situations where etching is difficult to perform. These situations include negative acid and temperature effects on adhesives and detector assemblies. Once etched, applying the low index epoxy yields no light collecting benefit, but in all cases the epoxy provides a mechanically robust coating
  • Keywords
    biomedical equipment; polishing; radioisotope imaging; refractive index; solid scintillation detectors; adhesives; chemical polishing; cut crystal elements; detector assemblies; energy resolution improvement; etching; lutetium oxyorthosilicate crystals; mechanically robust coating; medical diagnostic imaging; medical instrumentation; nuclear medicine; scintillation detector surfaces polishing; scintillator blocks; thin low refractive index epoxy layer; Assembly; Chemical elements; Crystals; Detectors; Energy resolution; Etching; Optical refraction; Performance evaluation; Scintillation counters; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5696-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1999.842776
  • Filename
    842776