DocumentCode :
2002293
Title :
Study of light collection in multi-crystal detectors
Author :
Saoudi, A. ; Pepin, C.M. ; Lecomte, R.
Author_Institution :
Clinical Res. Center, Sherbrooke Univ., Que., Canada
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
1215
Abstract :
Phoswich detectors are currently being considered by a number of investigators for depth-of-interaction measurement in PET and multi-modality emission/transmission imaging. Many parameters affect light collection and S/N ratio from such detectors, made of crystals having different emission wavelength, refractive index and light output. Experiments and simulation with DETECT97 have shown that light collection efficiency and energy resolution degrade steadily with distance from photodetector, mainly as a result of additional crystal interfaces. Simulation indicates that ground surfaces and high reflectivity diffuse reflector maximize light output. Measurements Lend to show that similar results are obtained with polished surfaces due to the presence of crystal defects. An excitation band at 400 nm in GSO is found to absorb a fraction of the light from scintillators emitting at short wavelengths, such as LSO. This effect is more significant for photodetectors such as PMTs that have their maximum sensitivity in the 400-nm range
Keywords :
biomedical equipment; positron emission tomography; solid scintillation detectors; 400 nm; DETECT97; PET; depth-of-interaction measurement; emission wavelength; light collection; light output; medical diagnostic imaging; medical instrumentation; multicrystal detectors; multimodality emission/transmission imaging; nuclear medicine; phoswich detectors; refractive index; Crystals; Current measurement; Degradation; Detectors; Energy resolution; Photodetectors; Positron emission tomography; Reflectivity; Refractive index; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
ISSN :
1082-3654
Print_ISBN :
0-7803-5696-9
Type :
conf
DOI :
10.1109/NSSMIC.1999.842777
Filename :
842777
Link To Document :
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