Growth and improved properties of ternary piezoelectric single crystals in lead indium niobate-lead magnesium niobate-lead titanate system

Author

Tian, Jian ; Han, Pengdi ; Carroll, James F. ; Payne, David A.

Author_Institution

H. C. Mater. Corp., Bolingbrook, IL, USA

fYear

2009

fDate

20-23 Sept. 2009

Firstpage

972

Lastpage

975

Abstract

Ternary piezoelectric crystals Pb(In_1/2Nb_1/2)O₃-Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ (PIN-PMN-PT) have improved thermal and electrical stability than binary PMN-PT. To better understand crystal system and optimize crystal properties, we systematically investigated crystal growth for compositions between the two binary end-members, PMN-PT and PIN-PT. The ternary system has a compositional window where crystals can be grown directly from stoichiometric melt. PIN-PMN-PT crystals exhibited excellent piezoelectric properties (e.g., k₃₃ ~0.87-0.92, d₃₃ ~1000-2200 pm/V). Higher PIN content further stabilized piezoelectric performance by ~40Â°C increase in T_R/T and more than doubling E_C (~7.0 kV/cm). Such improvements are important for applications at elevated temperature and/or high-drive conditions.

Keywords

crystal growth from melt; lead compounds; piezoelectric materials; thermal stability; Pb(In_0.5Nb_0.5)O₃-PMN-PbTiO₃; binary end-members; compositional window; crystal growth; crystal properties; crystal system; electrical stability; high-drive conditions; lead indium niobate-lead magnesium niobate-lead titanate system; piezoelectric properties; stoichiometric melt; ternary piezoelectric single crystals; thermal stability; Chemicals; Crystals; Dielectric measurements; Indium; Magnesium; Plasma temperature; Strain measurement; Temperature measurement; Thermal stability; Titanium compounds; PIN-PMN-PT; coercive field; ternary crystals; thermal stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium (IUS), 2009 IEEE International

Conference_Location

Rome

ISSN

1948-5719

Print_ISBN

978-1-4244-4389-5

Electronic_ISBN

1948-5719

Type

conf

DOI

10.1109/ULTSYM.2009.5441898

Filename

5441898