• DocumentCode
    2002447
  • Title

    Enhancing Sequential LEC Using a Cumulative Verification Methodology

  • Author

    Sheeley, Nathan ; Pena, Nico ; Waheed, Irfan ; Nodine, Mark

  • Author_Institution
    Intrinsity, Inc., Austin, TX
  • fYear
    2008
  • fDate
    8-10 Dec. 2008
  • Firstpage
    39
  • Lastpage
    42
  • Abstract
    This paper describes a methodology for verifying sequentially optimized designs using sequential equivalence checking. The problems associated with verifying large designs with complex changes using current sequential equivalence checking tools are presented. This methodology aims to solve some of these problems by simplifying either the size of the circuit or the number of changes presented to the checking tool at any one time. Key to this methodology is the use of a tool called rapport for generating wrappers for the blocks being verified. Finally, the challenges with the methodology and a case study of using the methodology to verify a RISC core are presented.
  • Keywords
    formal verification; logic design; microprocessor chips; complex design optimization; complex microprocessor verification; cumulative verification methodology; rapport tool; sequential logical equivalence checking; sequential optimized design verification; stand-alone wrapper; Circuits; Clocks; Design optimization; Formal verification; Latches; Logic design; Microprocessors; Pipelines; Reduced instruction set computing; Sequential analysis; equivalence; formal; rapport; sequential; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification, 2008. MTV '08. Ninth International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-4093
  • Print_ISBN
    978-1-4244-3682-8
  • Type

    conf

  • DOI
    10.1109/MTV.2008.10
  • Filename
    5070932