DocumentCode
2002447
Title
Enhancing Sequential LEC Using a Cumulative Verification Methodology
Author
Sheeley, Nathan ; Pena, Nico ; Waheed, Irfan ; Nodine, Mark
Author_Institution
Intrinsity, Inc., Austin, TX
fYear
2008
fDate
8-10 Dec. 2008
Firstpage
39
Lastpage
42
Abstract
This paper describes a methodology for verifying sequentially optimized designs using sequential equivalence checking. The problems associated with verifying large designs with complex changes using current sequential equivalence checking tools are presented. This methodology aims to solve some of these problems by simplifying either the size of the circuit or the number of changes presented to the checking tool at any one time. Key to this methodology is the use of a tool called rapport for generating wrappers for the blocks being verified. Finally, the challenges with the methodology and a case study of using the methodology to verify a RISC core are presented.
Keywords
formal verification; logic design; microprocessor chips; complex design optimization; complex microprocessor verification; cumulative verification methodology; rapport tool; sequential logical equivalence checking; sequential optimized design verification; stand-alone wrapper; Circuits; Clocks; Design optimization; Formal verification; Latches; Logic design; Microprocessors; Pipelines; Reduced instruction set computing; Sequential analysis; equivalence; formal; rapport; sequential; verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification, 2008. MTV '08. Ninth International Workshop on
Conference_Location
Austin, TX
ISSN
1550-4093
Print_ISBN
978-1-4244-3682-8
Type
conf
DOI
10.1109/MTV.2008.10
Filename
5070932
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