• DocumentCode
    2003548
  • Title

    Study of space charge characteristics in epoxy resin and its nanocomposites

  • Author

    Das, Supriyo ; Gupta, Nandini

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In recent times, there has been increased awareness of the fact that space charge within an insulating material considerably governs its dielectric behaviour. In this work, we study the nature of space charge trapping and detrapping in epoxy specimens, with and without nano sized fillers. After application of a poling field for a specific period of time, depolarisation characteristics are obtained by removing the voltage and placing the specimen under short circuit conditions. The release of space charge from deep traps provides a current in the external circuit which is measured using an electrometer. Recombination and transit time is considered to be negligible. Trap depth is calculated on the basis of depolarisation characteristics. The trap depth distribution is studied with variation in specimen thickness, applied electric field and temperature. Further, the effect of ageing is studied. In order to estimate the effect of fillers, alumina and other nano fillers are incorporated into the bulk epoxy resin to investigate whether this affects the trapped charge distribution.
  • Keywords
    electrometers; insulating materials; nanocomposites; resins; space charge; electrometer; epoxy resin; insulating material; nanocomposite; space charge characteristic; space charge detrapping; space charge trapping; trap depth distribution; Aging; Dielectrics; Electron traps; Epoxy resins; Polymers; Space charge; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5568066
  • Filename
    5568066