Title :
Investigation of single event effects at the system level
Author_Institution :
Comput. Devices Int., Bloomington, MN, USA
Abstract :
This work presents the results of single event upset (SEU) testing of a spaceborne 1750A processor, including interconnected logic (microprocessor), memory and I/O devices. Previously only the effect of interconnected logic devices was discussed. This work discusses system upset rates and the implications on analysis and testing of entire subsystems or systems
Keywords :
computer testing; integrated circuit testing; microprocessor chips; radiation effects; I/O devices; interconnected logic; memory testing; microprocessor chips; single event effects; single event upset; spaceborne 1750A processor; subsystems; system level; Ion beams; Logic devices; Logic testing; Microprocessors; Monitoring; Particle beams; Performance evaluation; Pins; Single event upset; System testing;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location :
St. Malo
Print_ISBN :
0-7803-1793-9
DOI :
10.1109/RADECS.1993.316544
