A Novel Analysis and Design Technique for Temperature Stable DROs

A novel analysis of a DRO in which the temperature stability is related to that of the DR cavity and the thermal variation of active device large signal admittance is presented. This serves as design tool for optimally stable DROs where a tradeoff can be struck between output power and temperature stability. A simpler design technique is also described which relies on the measurement of a DRO circuit with a known DR temperature coefficient A theoretical method for the prediction of the temperature stability of a DR is also presented and is shown to compare very well with experimental results. A fully automated load-pull system bas also been developed for the large signal characterisation of active devices and results are given for a medium power TED.