Title :
Degradation model and maintenance strategy of the electrolytic capacitors for electronics applications
Author :
Zhou, Yuege ; Ye, Xuerong ; Zhai, Guofu
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
Abstract :
The objective of this paper is to propose a maintenance strategy for aluminum electrolytic capacitors based on the degradation model. According to the physical structure, this paper gives the equivalent circuit model and studies the main degradation mechanism. The degradation parameter is discussed in detail in the equivalent circuit model, and the failure criterion is determined about the ESR and capacitance value. Meanwhile, the power factor correction circuit is designed as a target, and the degradation parameters of its output capacitor are monitored at different temperature. The Kalman filter algorithm and direct method are utilized to calculate the parameters of ESR and capacitance. After that, the prediction model related to ESR and capacitance is established by means of the obtained degradation data respectively. The maintenance strategy is described based on the prediction model in order to achieve the lowest running cost. The proposed method can improve the reliability and stability of power electronic circuit greatly.
Keywords :
Kalman filters; aluminium; circuit reliability; circuit stability; electrolytic capacitors; equivalent circuits; maintenance engineering; power electronics; power factor correction; Al; Kalman filter algorithm; aluminum electrolytic capacitor maintenance strategy; degradation model; equivalent circuit model; failure criterion; power electronic circuit reliability; power electronic circuit stability; power factor correction circuit; Degradation; Logic gates; Parameter estimation; condition monitoring; electrolytic capacitor; maintenance strategy; performance degradation;
Conference_Titel :
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-7951-1
Electronic_ISBN :
978-1-4244-7949-8
DOI :
10.1109/PHM.2011.5939474