• DocumentCode
    2004972
  • Title

    Field-induced Breakdown ESD Damage Of Magnetoresistive Recording Heads

  • Author

    Wallash, Albert ; Honda, Masamitsu

  • Author_Institution
    Quantum Corporation, 500 Mccarthy Boulevard, Milpitas, Ca 95035
  • fYear
    1997
  • fDate
    25-25 Sept. 1997
  • Firstpage
    382
  • Lastpage
    385
  • Keywords
    Biological system modeling; Electric breakdown; Electrostatic discharge; Failure analysis; Magnetic field measurement; Magnetic heads; Magnetoresistance; Spark gaps; Substrates; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    1-878303-69-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.1997.634266
  • Filename
    634266
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2004972