• DocumentCode
    2005153
  • Title

    Characterization Of ESD Damaged Magnetoresistive Recording Heads

  • Author

    Lam, Chung F. ; Salhi, El-Amine ; Chim, Seila

  • Author_Institution
    Read-rite Corporation , 44100 Osgood Road, Fremont, Ca 94538, U.s.a.
  • fYear
    1997
  • fDate
    25-25 Sept. 1997
  • Firstpage
    386
  • Lastpage
    397
  • Keywords
    Electric resistance; Electrical resistance measurement; Electrostatic discharge; Magnetic force microscopy; Magnetic heads; Magnetoresistance; Manufacturing; Scanning electron microscopy; Surface resistance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    1-878303-69-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.1997.634267
  • Filename
    634267
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2005153