Title :
Techniques for accelerated measurement of low bit error rates in computer data links
Author :
Palacharla, P. ; Chrostowski, J. ; Neumann, R. ; Gallenberger, R.J.
Author_Institution :
Inst. for Inf. Technol., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
We present techniques for the rapid estimation of very low (10-12 to 10-20) bit-error-rate (BER) in electrical and optical digital data links. Approximately 2 minutes elapsed time is required to perform a low BER test, independent of the actual BER value being measured. There are two types of applications: (1) confirming very low BER (<10-12) performance, and (2) reducing the time required to measure normal (10-9 to 10-12) BER values. These techniques are valid in the presence of BER floors
Keywords :
data communication; optical links; accelerated measurement; computer data links; low bit error rates; optical digital data links; Acceleration; Bit error rate; Circuit noise; Error analysis; Gaussian noise; High speed optical techniques; Noise figure; Optical fiber communication; Optical noise; Optical receivers;
Conference_Titel :
Computers and Communications, 1995., Conference Proceedings of the 1995 IEEE Fourteenth Annual International Phoenix Conference on
Conference_Location :
Scottsdale, AZ
Print_ISBN :
0-7803-2492-7
DOI :
10.1109/PCCC.1995.472493
