Title :
A BIST approach for testing FPGAs using JBITS
Author :
Niamat, M.Y. ; Hejeebu, Surya S. ; Alam, M.
Author_Institution :
Dept. of Eng. Technol., Toledo Univ., OH, USA
Abstract :
This paper explores the built-in self test (BIST) concepts to test the configurable logic blocks (CLBs) of static RAM (SRAM) based FPGAs using Java Bits (JBits). The proposed technique detects and diagnoses single and multiple stuck-at faults in the CLBs while significantly reducing the time taken to perform the testing. Previous BIST approaches for testing FPGAs use traditional CAD tools which lack control over configurable resources, resulting in the design being placed on the hardware in a different way than intended by the designer. In this paper, the design of the logic BIST architecture is done using JBits 2.8 software for Xilinx Virtex family of devices. The test requires seven configurations and two test sessions to test the CLBs. The time taken to generate the entire BIST logic in both the sessions is approximately 77 seconds as compared with several minutes to hours in traditional design flow.
Keywords :
Java; SRAM chips; automatic test pattern generation; built-in self test; fault diagnosis; field programmable gate arrays; logic CAD; logic testing; CAD tools; FPGA; JBits; Java Bits; SRAM; Xilinx Virtex family; built-in self test; configurable logic blocks; logic BIST architecture; static RAM; stuck-at faults; Automatic testing; Built-in self-test; Fault detection; Field programmable gate arrays; Java; Logic design; Logic devices; Logic testing; Performance evaluation; Random access memory;
Conference_Titel :
Field-Programmable Custom Computing Machines, 2005. FCCM 2005. 13th Annual IEEE Symposium on
Print_ISBN :
0-7695-2445-1
DOI :
10.1109/FCCM.2005.5
